期刊:Solid State Ionics [Elsevier BV] 日期:1982-10-01卷期号:7 (3): 177-198被引量:300
标识
DOI:10.1016/0167-2738(82)90050-9
摘要
Measurements of the Haven Ratio are conventionally performed in order to extract unique information about the diffusion mechanism in ionic conductors. In this review article, the historical background for such measurements, their present status, results, and the current theories of interpretation are discussed in detail with emphasis on the special problems found in fast ionic conductors. Likely directions for future work are also pointed out.