CMOS芯片
像素
CMOS传感器
图像传感器
数字射线照相术
平板探测器
射线照相术
计算机科学
探测器
射线探伤
噪音(视频)
点间距
计算机硬件
电气工程
电子工程
工程类
人工智能
物理
图像(数学)
机械工程
核物理学
焊接
作者
Michael G. Farrier,Thorsten Graeve Achterkirchen,Gene P. Weckler,Alex Mrozack
标识
DOI:10.1109/ted.2009.2031001
摘要
To address the growing demand for low-noise large-area digital-radiography sensors, a unique CMOS active-pixel sensor (APS) technology has been developed. Large-tiled CMOS radiographic panels can compete in performance with passive-pixel arrays, amorphous-silicon thin-film-transistor panels, and phosphor-panel technologies. Although CMOS sensors have become a key technology in low-cost consumer camera products, CMOS APS technology is also suited for manufacture of large-format imagers used to construct radiographic-detector panels. Large-area CMOS radiographic sensors combine a large full well over 3.5 million $e-$ with low read noise less than 300 $e-$ to provide wide dynamic range and improved signal-to-noise ratio under demanding radiographic imaging conditions. With precision-assembly techniques, tiling gaps are minimized to be less than 0.3 pixels to produce fully correctable flat-field images. Applications include nondestructive testing, scientific imaging, security screening, and medical radiography.
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