半导体
三元运算
材料科学
短期订单
钥匙(锁)
鉴定(生物学)
订单(交换)
自由度(物理和化学)
扫描透射电子显微镜
半导体材料
化学物理
统计物理学
纳米技术
透射电子显微镜
原子力显微镜
生物系统
半导体器件
电子
凝聚态物理
电子结构
三阶
计算机科学
拉伤
拓扑(电路)
化学
半导体纳米结构
物理
作者
Lilian Vogl,Shunda Chen,Peter Schweizer,Xiaochen Jin,Shui-Qing Yu,Jifeng Liu,Tianshu Li,Andrew M. Minor
出处
期刊:Science
[American Association for the Advancement of Science]
日期:2025-09-25
卷期号:389 (6767): 1342-1346
被引量:2
标识
DOI:10.1126/science.adu0719
摘要
Chemical short-range ordering is expected to be a key factor for tuning the electronic structure of semiconductors. However, experimental evidence of short-range ordering is still lacking due to the challenge of characterizing atomic-scale ordering motifs. Here, we determined the presence of short-range order in a ternary GeSiSn semiconductor system using advanced energy-filtered four-dimensional scanning transmission electron microscopy and large-scale atomistic models generated by a machine learning neuroevolution potential of first-principles accuracy. This approach revealed preferred ordering of different atomic species with the dominant occurrence of Si-Ge-Sn triplets. Our findings not only confirmed the presence of short-range order but also directly revealed the actual atomic structure, demonstrating the potential for informed atomic order-based band engineering as a third degree of freedom beyond composition and strain tuning.
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