金属
扫描隧道显微镜
密度泛函理论
工作职能
光化学
曲面(拓扑)
硫醇
吸附
共轭体系
作者
Bongsoo Kim,Seong Ho Choi,Xianjun Zhu,C. Daniel Frisbie
摘要
The tunneling resistance and electronic structure of metal–molecule–metal junctions based on oligoacene (benzene, naphthalene, anthracene, and tetracene) thiol and dithiol molecules were measured and correlated using conducting probe atomic force microscopy (CP-AFM) in conjunction with ultraviolet photoelectron spectroscopy (UPS). Nanoscopic tunnel junctions (∼10 nm2) were formed by contacting oligoacene self-assembled monolayers (SAMs) on flat Ag, Au, or Pt substrates with metalized AFM tips (Ag, Au, or Pt). The low bias (<0.2 V) junction resistance (R) increased exponentially with molecular length (s), i.e., R = R0 exp(βs), where R0 is the contact resistance and β is the tunneling attenuation factor. The R0 values for oligoacene dithiols were 2 orders of magnitude less than those of oligoacene thiols. Likewise, the β value was 0.5 per ring (0.2 A–1) for the dithiol series and 1.0 per ring (0.5 A–1) for the monothiol series, demonstrating that β is not simply a characteristic of the molecular backbone bu...
科研通智能强力驱动
Strongly Powered by AbleSci AI