电阻率和电导率
透射电子显微镜
材料科学
领域（数学分析）
电子显微镜
凝聚态物理
纳米技术
物理
光学
数学分析
数学
量子力学
作者
P.M. Bronsveld,S. Radelaar
摘要
Domain patterns in Au 3 Cu have been investigated by means of transmission electron microscopy. Samples were quenched from 800°C and subsequently annealed at temperatures between 100°C and 165°C for various periods of time. The electron microscopic observations are correlated with measurements of the electrical resistivity.
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