串联
降级(电信)
钙钛矿(结构)
商业化
硅
光伏系统
材料科学
纳米技术
计算机科学
工程物理
光电子学
电气工程
化学工程
业务
物理
工程类
电信
复合材料
营销
作者
Jae Hyun Park,Jin Young Kim
出处
期刊:Matter
[Elsevier BV]
日期:2022-10-01
卷期号:5 (10): 3091-3093
被引量:5
标识
DOI:10.1016/j.matt.2022.09.015
摘要
As the efficiency of perovskite/Si tandem solar cells (PVSK/Si TSCs) surpasses the practical limit of single-junction cells, consideration of device stability is critical for real-world application. Demonstrated recently, potential-induced degradation (PID) and partial recovery can occur in PVSK/Si TSCs depending on the external potential, indicating that the hitherto underresearched PID issues must be addressed for successful commercialization.
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