材料科学
电介质
微观结构
电容器
烧结
相变
相(物质)
陶瓷电容器
芯(光纤)
复合材料
光电子学
凝聚态物理
电气工程
化学
电压
工程类
有机化学
物理
作者
Daniel E. McCauley,Mike S. H. Chu,Mohammed Megherhi
标识
DOI:10.1111/j.1551-2916.2005.00661.x
摘要
The diffuse‐phase transition in BaTiO 3 ‐based dielectrics for capacitor applications has been studied with respect to its dependence on oxygen partial pressure during sintering. Understanding the mobility of this transition is critical in developing next generation dielectrics for ultra thin (≤1 μm) applications while maintaining the appropriate temperature stability and insulation resistance. Historically, a heterogeneous core/shell microstructure was developed to maintain temperature stability. However, in fired grains of ≤250 nm (required for layers ≤1 μm) a well‐defined core/shell structure is very difficult to establish. The results from this study demonstrate that careful control of the diffuse‐phase transition addresses some of these problems.
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