光电子学
材料科学
半导体
等离子体
氢
二极管
太阳能电池
X射线光电子能谱
耗尽区
化学
化学工程
量子力学
物理
工程类
有机化学
作者
Bikesh Gupta,Mohamed M. Shehata,Yonghwan Lee,Lachlan E. Black,Fa‐Jun Ma,Bram Hoex,C. Jagadish,Hark Hoe Tan,Siva Krishna Karuturi
出处
期刊:Solar RRL
[Wiley]
日期:2023-01-18
卷期号:7 (6)
被引量:8
标识
DOI:10.1002/solr.202200868
摘要
III–V semiconductors are among the highest performing materials for solar energy conversion devices. Exposing III–V semiconductors to a hydrogen plasma can improve optoelectronic properties and is a critical step in fabricating efficient InP solar cells. However, there is a limited understanding of the changes induced by hydrogen plasma exposure to the surface and in the bulk of III–V semiconductors. Herein, it is demonstrated that a 19.3% efficient p‐InP solar cell with a TiO 2 electron selective contact layer can be achieved by exposing the InP substrate to hydrogen plasma. Detailed investigations employing ultraviolet photoelectron spectroscopy and capacitance–voltage measurement unveil that the hydrogen plasma exposure on p‐InP leads to charge carrier polarity inversion in the near‐surface region (charge inversion layer) while simultaneously reducing the carrier concentration (charge‐depleted layer) in the bulk. The study provides important insights into the impact of hydrogen plasma exposures on InP which may lead to more efficient optoelectronic devices such as solar cells, photodetectors, light‐emitting diodes, and photoelectrochemical cells.
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