光刻胶
光敏性
抵抗
聚氨酯
材料科学
光化学
激进的
化学工程
高分子化学
化学
纳米技术
光电子学
复合材料
有机化学
图层(电子)
工程类
作者
Shi‐Li Xiang,Peng-Fei Luo,Ying‐Yi Ren,Ling‐Yan Peng,Hong Yin,Jun‐Dan Huang,Hong Pan,Qi Yu,Rui Tian,Chong Li,Jun Liu,Ming‐Qiang Zhu
标识
DOI:10.1021/acsapm.3c02610
摘要
As the key material for semiconductor manufacturing, the production technology of a photoresist (PR) is complex, with many varieties and specifications. Therein, the synthesis of current resins and photosensitizers used for the preparation of the i-line photoresist is complicated, and the reaction products may even cause lens pollution. Herein, a kind of photodegradable polyurethane (PU) positive photoresist with a simple system was designed and prepared, in which photocleavable hexaarylbiimidazole (HABI) and tert-butylhydroquinone (TBHQ) were used as a cross-linker and a radical scavenger, respectively. The C–N bond inside the HABI unit was broken under UV irradiation, causing the reversible transformation of HABI into two triphenylimidazole radicals (TPIRs), which were subsequently quenched by TBHQ. Thus, the superpolymer formed an oligomer that could be dissolved in the developer. It was found that HABI-PU PR showed excellent photosensitivity as a positive photoresist during micro–nano manufacturing. The relationship between the content of HABI and TBHQ and resolution and the reaction mechanism between TPIR and TBHQ were studied systematically, and a linear pattern with 1 μm dimension was obtained finally.
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