光致发光
跟踪(教育)
杂质
光谱学
晶体缺陷
兴奋剂
航程(航空)
材料科学
合金
光电子学
点(几何)
凝聚态物理
分析化学(期刊)
化学
物理
冶金
复合材料
数学
心理学
教育学
几何学
有机化学
色谱法
量子力学
作者
Ji Hyun Kim,Pegah Bagheri,Ronny Kirste,Pramod Reddy,Ramón Collazo,Zlatko Sitar
标识
DOI:10.1002/pssa.202200390
摘要
A comprehensive energy map as a function of AlGaN composition over the whole alloy range is presented for commonly observed point defects in nominally intrinsic, n‐, and p‐doped material. The map covers intentional and unintentional impurities (C N , Mg III ), vacancies (V III , V N ), passivating complexes (H), and self‐compensating complexes. The tracking of these defects is crucial to understand their impact on optical and electrical properties as well as for their mitigation.
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