石墨烯
功勋
折射率
太赫兹辐射
材料科学
灵敏度(控制系统)
等离子体子
棱镜
光电子学
光学
物理
纳米技术
电子工程
工程类
作者
Yi Huang,Shuncong Zhong,Haizi Yao,Daxiang Cui
出处
期刊:IEEE Photonics Journal
[Institute of Electrical and Electronics Engineers]
日期:2017-01-20
卷期号:9 (1): 1-10
被引量:24
标识
DOI:10.1109/jphot.2017.2656242
摘要
We propose a layer-by-layer graphene/insulator stacks based terahertz plasmonic sensor of refractive index of testing samples using a prism-coupling attenuated total reflection configuration. An angular interrogation technique has been used to explore the performance of the sensor in terms of detecting accuracy, sensitivity, and figure of merit (FOM). From the analysis of theoretical resonance angle of the sensor and the finite element method (FEM) based simulation, we reveal that the number of graphene layer (N), the Fermi level energy (E F ) of graphene, and refractive index of testing samples have a great effect on these performance parameters. The simulated results show that more layers of graphene will result in higher detection accuracy but lower sensitivity and FOM. The effective detection accuracy can be improved through high doping levels or with multilayer graphene. The maximum detection accuracy is 7.14 degree-1 for N = 5 at E F = 1.6eV. The maximum sensitivity is 51.0°/RIU, along with a FOM up to 12.75 RIU -1 for N = 1 at E F = 1.0eV.
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