热导率
材料科学
热电效应
热导率测量
薄膜
瞬态(计算机编程)
半导体
光电子学
热的
热电材料
激光器
光学
复合材料
纳米技术
计算机科学
热力学
物理
操作系统
作者
Yifeng Ling,Meng Han,Junjie Xie,Guojuan Qiu,Guoying Dong,Erbiao Min,Ping Zhang,Rong Sun,Ruiheng Liu,Rong Sun
出处
期刊:Measurement
[Elsevier]
日期:2023-08-01
卷期号:217: 113058-113058
标识
DOI:10.1016/j.measurement.2023.113058
摘要
Accurate and rapid measurement of thermal conductivity of thin films has been a challenge so far in the field of thermoelectric (TE) materials and devices. Herein, we proposed to use a transient photo-electro-thermal (TPET) technique to measure the thermal conductivity of TE thin-films with convenience. Combining theoretical and experimental methods, we found that the TPET technique using laser beam heating can significantly reduce the influence of Peltier effect and thus achieve high test accuracy. The measurement uncertainty of TPET technique for TE films can be depressed below 10%. Furthermore, this method is not only applicable for free-standing thin film, but also for thin film deposited on as-known substrates. Finally, thermal conductivity of several films including p-type Bi0.5Sb1.5Te3, n-type Ag2Se, and n-type Bi2Te3 deposited on PI film at different temperature are accurately measured, which demonstrates the wide applicability of TPET technique on semiconductor films.
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