电子能量损失谱
扫描透射电子显微镜
光谱学
材料科学
透射电子显微镜
价(化学)
原子物理学
电子
Atom(片上系统)
价电子
能量过滤透射电子显微镜
X射线光谱学
物理
纳米技术
量子力学
嵌入式系统
计算机科学
作者
Haiyan Tan,Stuart Turner,Emrah Yücelen,Johan Verbeeck,Gustaaf Van Tendeloo
标识
DOI:10.1103/physrevlett.107.107602
摘要
Using a combination of high-angle annular dark-field scanning transmission electron microscopy and atomically resolved electron energy-loss spectroscopy in an aberration-corrected transmission electron microscope we demonstrate the possibility of 2D atom by atom valence mapping in the mixed valence compound Mn3O4. The Mn L(2,3) energy-loss near-edge structures from Mn2+ and Mn3+ cation sites are similar to those of MnO and Mn2O3 references. Comparison with simulations shows that even though a local interpretation is valid here, intermixing of the inelastic signal plays a significant role. This type of experiment should be applicable to challenging topics in materials science, such as the investigation of charge ordering or single atom column oxidation states in, e.g., dislocations.
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