From the physics of secondary electron emission to image contrasts in scanning electron microscopy

Journal Article From the physics of secondary electron emission to image contrasts in scanning electron microscopy Get access Jacques Cazaux Jacques Cazaux * Laboratoire d'Ingénierie et Sciences des Matériaux (LISM), EA 4695, Faculty of Sciences, BP 1039, 51687 Reims Cedex 2, France *To whom correspondence should be addressed. Email: jacques.cazaux@univ-reims.fr Search for other works by this author on: Oxford Academic PubMed Google Scholar Journal of Electron Microscopy, Volume 61, Issue 5, October 2012, Pages 261–284, https://doi.org/10.1093/jmicro/dfs048 Published: 07 August 2012 Article history Received: 17 January 2012 Revision received: 22 April 2012 Accepted: 18 May 2012 Published: 07 August 2012