晶体管
材料科学
分析物
光电子学
绝缘体(电)
薄膜晶体管
有机半导体
半导体
电极
场效应晶体管
电压
灵敏度(控制系统)
纳米技术
电气工程
电子工程
化学
物理化学
工程类
图层(电子)
作者
Joshua N. Arthur,Soniya D. Yambem
标识
DOI:10.1002/admt.202101149
摘要
Abstract Hygroscopic insulator field effect transistors (HIFETs) are a class of solid‐state, low‐voltage organic thin film transistors with promising sensitivity to hydrogen peroxide (H 2 O 2 ). While work has progressed on the development and understanding of HIFET‐based sensors, important questions regarding the fundamental H 2 O 2 sensing mechanisms need to be fully investigated. In this work, a detailed study of the effects of H 2 O 2 on the transient drain currents and transfer characteristics of HIFETs, while varying analyte concentrations and device voltages, is presented. The sensing mechanism is found to be consistent with the direct oxidation of the organic semiconductor channel, poly(3‐hexylthiophene‐2,5‐diyl), by H 2 O 2 diffused into the device through the permeable top gate electrode and hygroscopic insulator. Further, the importance of having a transistor structure in sensing H 2 O 2 , as compared to a two‐terminal device, is demonstrated. These results represent important progress in the understanding of HIFET‐based sensors, revealing paths for future applications and optimization.
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