转换器
碳化硅
电力电子
失效物理学
可靠性工程
功率半导体器件
电源模块
可靠性(半导体)
数码产品
电子工程
计算机科学
光伏系统
电气工程
电力系统
变压器
功率(物理)
电压
工程类
材料科学
冶金
物理
量子力学
作者
Ze Ni,Xiaofeng Lyu,Om Prakash Yadav,Brij N. Singh,Sheng Zheng,Dong Cao
标识
DOI:10.1109/tpel.2019.2962503
摘要
Remaining useful lifetime prediction and extension of Si power devices have been studied extensively. Silicon carbide (SiC) power devices have been developed and commercialized. Specifically, SiC mosfets have been utilized for the next generation high-voltage, high-power converters with smaller size and higher efficiency, covering various mainstream applications, including photovoltaic systems, electric vehicles, solid-state transformers, and more electric ships and airplanes. However, the SiC-based devices have different failure modes and mechanisms compared with Si counterparts. Therefore, a comprehensive review is critical to develop accurate lifetime prediction and extension strategies for SiC power converter systems. The SiC power device component-level failure modes and mechanisms are first investigated. Different accelerated lifetime tests and component-level lifetime models are then compared. Power converter system-level offline lifetime modeling techniques and software tools are further summarized. Besides, the SiC power converter condition monitoring strategies and health indicators are surveyed. The online measurement challenges are also studied. Furthermore, the system-level lifetime extension strategies are reviewed. By integrating device physics, statistical modeling, reliability engineering, and mechanical engineering with power electronics, this article is intended to provide a comprehensive overview, address existing challenges, and unfold new research opportunities regarding the SiC power converter real-time lifetime prediction and extension.
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