Atom(片上系统)
密度泛函理论
从头算
石墨烯纳米带
电子结构
作者
Kenan Elibol,Clemens Mangler,David D. O'Regan,Kimmo Mustonen,Dominik Eder,Jannik C. Meyer,Jani Kotakoski,Richard G. Hobbs,Toma Susi,Bernhard C. Bayer
出处
期刊:ACS Nano
[American Chemical Society]
日期:2021-08-19
卷期号:15 (9): 14373-14383
被引量:1
标识
DOI:10.1021/acsnano.1c03535
摘要
Single atoms and few-atom nanoclusters are of high interest in catalysis and plasmonics, but pathways for their fabrication and placement remain scarce. We report here the self-assembly of room-temperature-stable single indium (In) atoms and few-atom In clusters (2-6 atoms) that are anchored to substitutional silicon (Si) impurity atoms in suspended monolayer graphene membranes. Using atomically resolved scanning transmission electron microscopy (STEM), we find that the symmetry of the In structures is critically determined by the three- or fourfold coordination of the Si anchors. All structures are produced without electron-beam induced materials modification. In turn, when activated by electron beam irradiation in the STEM, we observe in situ the formation, restructuring, and translation of the Si-anchored In structures. Our results on In-Si-graphene provide a materials system for controlled self-assembly and heteroatomic anchoring of single atoms and few-atom nanoclusters on graphene.
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