探测器
光学
图像传感器
荧光寿命成像显微镜
灵敏度(控制系统)
CMOS传感器
材料科学
蒙特卡罗方法
荧光
物理
电子工程
数学
统计
工程类
作者
Yun-Tzu Chang,Edward Van Sieleghem,Jiwon Lee,Pol Van Dorpe,Chris Van Hoof
出处
期刊:Applied Optics
[The Optical Society]
日期:2021-08-20
卷期号:60 (24): 7446-7446
被引量:1
摘要
In this paper, a computational performance analysis is presented of a wide-field time-gated fluorescence lifetime imaging microscope (FLIM) using practically realizable properties of the laser, sample, and a three-tap time-gated CMOS image sensor. The impact of these component-level properties on the accuracy and the precision of the measurement results are estimated and discussed based on Monte Carlo simulations. The correlation between the detector speed and the accuracy of the extracted fluorescence lifetime is studied, and the minimum required incident photoelectron number of each pixel is estimated for different detector speeds and different fluorescence lifetime measurements. In addition, the detection limits due to the dark current and the parasitic light sensitivity of the detector are also investigated. This work gives an overview of the required fluorescence emission condition as well as the required detector properties for a three-tap time-gated image sensor to achieve good FLIM data in biological applications.
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