X射线光电子能谱
材料科学
离子键合
胶粘剂
氧化物
氢键
阳极连接
亚氧化物
硅氧烷
化学工程
氰基丙烯酸酯
硅
表面能
纳米技术
复合材料
化学
分子
离子
有机化学
聚合物
图层(电子)
氰基丙烯酸酯
工程类
冶金
作者
Philipp Moritz,Friedrich A. Burger,Oliver Höfft,Lienhard Wegewitz,Wolfgang Maus‐Friedrichs
标识
DOI:10.1021/acs.jpcc.1c06477
摘要
Cyanoacrylates form a highly reactive class of adhesives that provide significant adhesive strength to surfaces within a few seconds. Despite their commercial use, the exact bonding mechanism is virtually unknown. In the present work, we spin coat nanometer-thin films of ethyl cyanoacrylate on two model substrates: gold and silicon dioxide. This allows the interface to be studied directly with X-ray photoelectron spectroscopy (XPS). Thus, investigations are feasible to identify chemical interactions at the boundary between the adhesive and metal (oxide), which are possible reasons for film adhesion on the macroscopic scale. On SiO2, an increase in the binding energy of the O═C–O group was observed in thin films, indicating hydrogen bonding with the oxide surface. Metastable induced electron spectroscopy measurements consistently indicate a preferential orientation of the carbonyl group toward the silicon dioxide surface. Furthermore, evidence for an ionic interaction of the adhesive via a carboxylate ion (COO–) with the SiO2 substrate was found by XPS. On gold, on the other hand, neither evidence of an ionic interaction nor evidence of hydrogen bonding could be found.
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