材料科学
铼
热传导
凝聚态物理
范德瓦尔斯力
量子隧道
电子
电导率
化学物理
光电子学
复合材料
化学
物理
物理化学
有机化学
冶金
量子力学
分子
作者
Byung Chul Lee,Junhong Na,Jun Hee Choi,Hyunjin Ji,Gyu Tae Kim,Min‐Kyu Joo
标识
DOI:10.1002/adma.201805860
摘要
Abstract Charge carrier transport in multilayer van der Waals (vdW) materials, which comprise multiple conducting layers, is well described using Thomas–Fermi charge screening (λ TF ) and interlayer resistance ( R int ). When both effects occur in carrier transport, a channel centroid migrates along the c ‐axis according to a vertical electrostatic force, causing redistribution of the conduction centroid in a multilayer system, unlike a conventional bulk material. Thus far, numerous unique properties of vdW materials are discovered, but direct evidence for distinctive charge transport behavior in 2D layered materials is not demonstrated. Herein, the distinctive electron conduction features are reported in a multilayer rhenium disulfide (ReS 2 ), which provides decoupled vdW interaction between adjacent layers and much high interlayer resistivity in comparison with other transition‐metal dichalcogenides materials. The existence of two plateaus in its transconductance curve clearly reveals the relocation of conduction paths with respect to the top and bottom surfaces, which is rationalized by a theoretical resistor network model by accounting of λ TF and R int coupling. The effective tunneling distance probed via low‐frequency noise spectroscopy further supports the shift of electron conduction channel along the thickness of ReS 2 .
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