In-Situ Studies toward the Occurrence of “Pseudoelasticity” in Confined Nanostructured NiTi Films and Its Implications toward “Stress Buffering” during Electrochemical Li-Alloying/De-Alloying of Si

The combination of in-situ synchrotron X-ray diffraction and in-situ stress measurements performed during electrochemical Li-alloying/-dealloying of amorphous Si (a-Si) films, having ∼150 nm thick ...