材料科学
单层
纳米技术
二硫化钨
化学气相沉积
半导体
光电子学
光电探测器
场效应晶体管
数码产品
晶体管
原子层沉积
带隙
工程物理
薄膜
电气工程
电压
冶金
工程类
作者
Zhihan Jin,Tianci Huang,Liping Chen,Kai‐Li Wang,Shancheng Yan,Hao Liu,Chee Leong Tan
出处
期刊:Nanotechnology
[IOP Publishing]
日期:2025-01-28
卷期号:36 (14): 142002-142002
被引量:4
标识
DOI:10.1088/1361-6528/adaf2a
摘要
Abstract Two-dimensional transition metal dichalcogenides (2D TMDs) have attracted considerable interest in materials science due to their exceptional electronic and optoelectronic characteristics, such as high carrier mobility and adjustable band gaps. Although extensive studies have been conducted on various TMDs, a significant gap persists in the understanding of synthesis methods and their effects on the practical use of monolayer tungsten disulfide (WS 2 ) in optoelectronic devices. This gap is crucial, as the effective incorporation of WS 2 into commercial applications relies on the establishment of dependable synthesis techniques that guarantee the material’s high quality and uniformity. In this review, we provide a detailed examination of the synthesis methods for monolayer WS 2 , emphasizing mechanical stripping, atomic layer deposition (ALD), and chemical vapor deposition (CVD). We discuss the benefits of each technique, including the uniform growth achievable with ALD at lower temperatures and the ability of CVD to generate large-area, high-quality monolayer. Furthermore, we review the performance of WS 2 in various electronic and optoelectronic applications, such as field-effect transistors, photodetectors, and logic devices. Our review suggest that ongoing improvements in film uniformity, compatibility with current semiconductor processes, and the long-term stability of WS 2 -based devices indicate a promising pathway for transitioning 2D WS 2 from laboratory settings to practical applications.
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