铜
异质结
半导体
材料科学
硒化物
金属
光电子学
硒化锌
Atom(片上系统)
曲面重建
纳米技术
曲面(拓扑)
硒
冶金
计算机科学
几何学
数学
嵌入式系统
作者
Meiling Chen,Wenhao Liu,Pengcheng Ding,Feng-Wu Guo,Zhuo Li,Yanghan Chen,Yi Wei,Ye Sun,Jianchen Lu,Lev Kantorovich,Miao Yu
标识
DOI:10.1038/s41467-025-57012-4
摘要
The photoinduced semiconductor-to-metal transition (PSMT) unveils crucial photodynamic mechanisms and holds great promise for information storage, sensing, optoelectronics, optical switches, etc. All previously reported PSMTs have occurred between two structural phases of the same material, lacking real-space evidence at the atomic or molecular level. Herein, we report atomic-scale observations of a photoinduced 'face changing': light irradiation transforms a semiconductor copper selenide (Cu2Se) surface layer on Cu(111) into a well-defined metallic Cu layer. Se atoms sink to form a new Cu2Se sublayer, while the original subsurface Cu atoms are lifted to the top layer. The Cu2Se-to-Cu transition barrier is significantly lower in the excited state compared to the ground state. Thermoactivation enables the reverse transition. The photoinduced Cu2Se-to-Cu and thermoactivated Cu-to-Cu2Se transitions are highly reversible. This work, which demonstrates PSMT between two distinct materials and photo-driven interlayer atom migration, unlocks an unconventional and intriguing route for PSMT and surface modification technologies. Photoinduced semiconductor-to-metal transitions are usually between different phases of the same material. Here the authors show the transformation of a single layer Cu2Se on Cu(111) into a metallic Cu surface layer and uncover its mechanism.
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