失效物理学
可靠性(半导体)
可靠性工程
过程(计算)
新产品开发
失效机理
产品(数学)
计算机科学
系统工程
工程类
物理
结构工程
量子力学
操作系统
业务
营销
功率(物理)
数学
几何学
作者
Michael Pecht,Abhijit Dasgupta
出处
期刊:IEEE International Integrated Reliability Workshop final report
日期:2002-11-19
卷期号:: 1-4
被引量:80
标识
DOI:10.1109/irws.1995.493566
摘要
Reliability assessments based on physics-of-failure methods incorporate reliability into the design process to prevent parts from failing in service. An understanding of the physics-of-failure is necessary in applications which afford little opportunity for testing, or for reliability growth. This paper presents an overview of physics-of-failure and a case study of the application of physics-of-failure to a specific failure mechanism called conductive filament formation.
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