GSM演进的增强数据速率
计算机科学
医学
人工智能
作者
Ruilang Ji,Xiongliang Wei,Li Li,Yaohua Wang,Mingchao Gao,Guoliang Yuan,Songwei Li,Chijie Zhuang
标识
DOI:10.1049/icp.2024.2391
摘要
A new double negative beveled angle edge termination structure, which utilises a mesa-like chamfer and decouples the junction depth of the active region and edge termination, has been proposed and the rule of the effect of various structural parameters on the edge termination's breakdown voltage has been analysed. An optimization approach for the edge termination's structural parameters is presented, which can resolve the dual contradiction between the edge termination's breakdown voltage and the active region's performance, as well as the edge termination's breakdown voltage and process feasibility. TCAD simulation studies indicate that, under given conditions, the effective utilization rate of the chip area reaches 90.572%, while the breakdown voltage efficiency reaches 93.3%.
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