Emerging Technique for Detecting Damage on Various Photovoltaic Module Layouts

V10 is a new damage identification and quantification metric based on the voltage required to pass 10mA through a module in the dark. It is sensitive to minor cracking in PV modules due to transportation, handling, extreme weather, and vibrations. In addition to our previous work, this work presents additional experimental validation of the V10 technique in modules with different cell architectures, cell cut, and module/substring layouts, showing the extensibility of the technique. Location dependence and the impact of cell string mismatch on V10 crack detection is explored. This dataset was used in the following study: 10.13140/RG.2.2.35599.70567, presented at the PV Reliability Workshop, 2025. It includes flash I-V, V10, EL images, pseudo-I-V, and lifetime-injection data for three different module technologies at increasing levels of mechanical damage.