材料科学
介电谱
极化(电化学)
腐蚀
恒流
半导体
恒相元件
冶金
肖特基二极管
复合材料
电化学
电流(流体)
光电子学
化学
电气工程
电极
物理化学
工程类
二极管
作者
Xuequn Cheng,Xiaogang Li,Cuiwei Du
标识
DOI:10.1007/s11434-009-0158-7
摘要
Semiconductor properties of the passive films formed on 316L and 2205 stainless steel were studied by Electrochemical Impedance Spectroscopy (EIS) in the high-temperature acetic acid. The results showed that the corrosion resistance of 2205 was higher than that of 316L, and the passive films formed on 316L and 2205 stainless steel showed p-type and n-type semiconductor behavior, respectively. Destruction and self-repairing of passive films were studied by using the constant current polarization method. The results showed that for 316L, the self-repairing process would occur when the destruction was lower than the critical extent or it would not do; for 2205, the self-repairing process only happened in a short time when the destruction was in the same extent as 316L.
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