单晶硅
抛光
材料科学
表面粗糙度
基质(水族馆)
硅
机械加工
表面光洁度
光学
均方根
光电子学
复合材料
物理
冶金
地质学
海洋学
量子力学
作者
Zhe Wang,Lingqi Wu,Aihuan Dun,Yuanyuan Fang,Song Li,Xiaolei Zhu
标识
DOI:10.1080/09500340.2020.1817589
摘要
X-ray mirrors are an important part of the beam line in advanced light sources and have a stringent surface roughness, and monocrystalline silicon is the preferred substrate material for X-ray mirror. A method of improving the surface roughness of X-ray mirror, based on optimized density and dynamic viscosity of the polishing fluid, is analyzed and tested experimentally. The experimental results show that the surface roughness of monocrystalline silicon substrates was reduced significantly, with the root mean square of surface roughness decreasing from 0.420 nm to 0.272 nm, corresponding to an improvement of approximately 32%.
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