Lifetime modelling of discrete power electronic devices for automotive applications

Lifetime modelling of electronic components and systems represents an important pillar of reliability research. Its main objective is the achievement of an accurate lifetime prediction for a given product or technology well before product release in order to assure the intended functionality for a given application scenario and time period. As baseline, extensive lifetime tests are necessary to investigate the dependency of the lifetime on various influencing factors occurring during operation. This paper will focus on the development of lifetime models for discrete power electronic devices based on power cycling tests. In contrast to existing lifetime models for standard IGBT based modules, the achieved results show that in case of transfer molded packages the glass transition temperature Tg needs to be taken into account.