分辨率(逻辑)
材料科学
纳米技术
高分辨率
计算机科学
人工智能
地质学
遥感
作者
John Leo Velpugonda,V. Naresh,Matthew Yerich,Lih Y. Lin
出处
期刊:Light: advanced manufacturing
[Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences]
日期:2025-01-01
卷期号:6 (2): 1-1
被引量:1
标识
DOI:10.37188/lam.2025.015
摘要
A universal method of micro-patterning thin quantum dot films is highly desired by industry to enable the integration of quantum dot materials with optoelectronic devices. Many of the methods reported so far, including specially engineered photoresist or ink-jet printing, are either of poor yield, resolution limited, difficult to scale for mass production, overly expensive, or sacrificing some optical quality of the quantum dots. In our previous work, we presented a dry photolithographic lift-off method for pixelization of solution-processed materials and demonstrated its application in patterning perovskite quantum dot pixels, 10 µm in diameter, to construct a static micro-display. This report presents further development of this method and demonstrates high-resolution patterning (~1 µm diameter), full-scale processing on a 100 mm wafer, and multi-color integration of two different varieties of quantum dots. Perovskite and cadmium-selenide quantum dots were adopted for the experimentation, but the method can be applied to other types of solution-processed materials. We also demonstrate the viability of this method for constructing high-resolution micro-arrays of quantum dot color-convertors by fabricating patterned films directly on top of a blue gallium-nitride LED substrate. The green perovskite quantum dots used for fabrication were synthesized via the room-temperature ligand-assisted reprecipitation method developed by our research group, yielding a photoluminescent quantum yield of 93.6% and full-width half-maximum emission linewidth less than 20 nm. Our results demonstrate the viability of this method for use in scalable manufacturing of high-resolution micro-displays paving the way for improved optoelectronic applications.
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