扫描透射电子显微镜
扫描共焦电子显微镜
透射电子显微镜
扫描电子显微镜
暗场显微术
沸石
直接成像
本地字段
能量过滤透射电子显微镜
光学
材料科学
领域(数学)
电子断层摄影术
显微镜
纳米技术
物理
化学
凝聚态物理
催化作用
数学
纯数学
生物化学
作者
Kousuke Ooe,Takehito Seki,Kaname Yoshida,Yuji Kohno,Yuichi Ikuhara,Naoya Shibata
出处
期刊:Science Advances
[American Association for the Advancement of Science]
日期:2023-08-02
卷期号:9 (31)
被引量:23
标识
DOI:10.1126/sciadv.adf6865
摘要
Zeolites are used in industries as catalysts, ion exchangers, and molecular sieves because of their unique porous atomic structures. However, direct observation of zeolitic local atomic structures via electron microscopy is difficult owing to low electron irradiation resistance. Subsequently, their fundamental structure-property relationships remain unclear. A low-electron-dose imaging technique, optimum bright-field scanning transmission electron microscopy (OBF STEM), has recently been developed. It reconstructs images with a high signal-to-noise ratio and a dose efficiency approximately two orders of magnitude higher than that of conventional methods. Here, we performed low-dose atomic-resolution OBF STEM observations of two types of zeolite, effectively visualizing all atomic sites in their frameworks. In addition, we visualized the complex local atomic structure of the twin boundaries in a faujasite (FAU)-type zeolite and Na+ ions with low occupancy in eight-membered rings in a Na-Linde Type A (LTA) zeolite. The results of this study facilitate the characterization of local atomic structures in many electron beam-sensitive materials.
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