钙钛矿(结构)
卤化物
二极管
光电探测器
材料科学
光电子学
直接成像
半导体
灵敏度(控制系统)
X射线探测器
发光二极管
纳米技术
探测器
光学
电子工程
物理
工程类
化学
化学工程
无机化学
作者
Yirong Su,Wenbo Ma,Yang Yang
标识
DOI:10.1088/1674-4926/41/5/051204
摘要
Abstract Halide perovskites have emerged as the next generation of optoelectronic materials and their remarkable performances have been attractive in the fields of solar cells, light-emitting diodes, photodetectors, etc. In addition, halide perovskites have been reported as an attractive new class of X-ray direct detecting materials recently, owning to the strong X-ray stopping capacity, excellent carrier transport, high sensitivity, and cost-effective manufacturing. Meanwhile, perovskite based direct X-ray imagers have been successfully demonstrated as well. In this review article, we firstly introduced some fundamental principles of direct X-ray detection and imaging, and summarized the advances of perovskite materials for these purposes and finally put forward some needful and feasible directions.
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