螺旋钻
辐射传输
俄歇效应
量子阱
物理
原子物理学
凝聚态物理
库仑
载流子密度
载流子寿命
指数函数
材料科学
计算物理学
量子力学
硅
电子
光电子学
兴奋剂
数学分析
激光器
数学
作者
J. Hader,Jerome V. Moloney,Stephan W. Koch
标识
DOI:10.1109/jqe.2007.910938
摘要
Fully microscopic models are used to study the temperature dependence of carrier losses due to radiative and Auger recombination processes in semiconductor quantum wells. The temperature (T) dependence of these loss processes is shown to depend on the carrier density, on details of the bandstructure, and on the Coulomb effects. While classical estimates based on simplified models predict a density independent 1/T-variation of the radiative losses, we find for the example of typical 1.3 mum InGaAsP structures a dependence closer to 1/T 3 at low densities. At high densities the temperature dependence is much weaker and can no longer be described by a simple power law. For a given density the Auger losses can be described by an exponential temperature dependence for limited temperature ranges if one uses a density dependent activation energy that can take positive or negative values.
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