衍射
X射线晶体学
表征(材料科学)
土工试验
矿物
成岩作用
材料科学
仪表(计算机编程)
鉴定(生物学)
环境科学
矿物学
土壤科学
土壤水分
地质学
计算机科学
冶金
纳米技术
物理
光学
植物
生物
操作系统
作者
Qianqian Wang,Cheng Gu
出处
期刊:Elsevier eBooks
[Elsevier]
日期:2023-01-01
卷期号:: 642-653
被引量:1
标识
DOI:10.1016/b978-0-12-822974-3.00037-9
摘要
Since the discovery of single-crystal X-ray diffraction (XRD), various X-ray diffractometers have been developed and utilized for the identification, characterization and quantification of soil components because of their convenience, efficiency, accuracy and non-destruction. Amongst soil components, soil minerals often act as an indicator of diagenesis in soil, which can be identified and quantified by XRD techniques. Basic principles, methodology and instrumentation of XRD and factors affecting the XRD signal strength are described in this chapter. Moreover, the application of XRD in soil analysis is revealed, especially for soil mineral qualification, soil mineral quantification and soil evolution.
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