反铁电性
材料科学
纳米尺度
极化(电化学)
光电发射电子显微术
铟
凝聚态物理
光电子学
纳米技术
铁电性
光学
物理
化学
电子显微镜
物理化学
电介质
作者
Joseph L. Spellberg,Lina Kodaimati,Prakriti P. Joshi,Nasim Mirzajani,Liangbo Liang,Sarah B. King
标识
DOI:10.26434/chemrxiv-2024-lmx75
摘要
Antiferroelectric (AFE) materials are excellent candidates for sensors, capacitors, and data storage due to their electrical switchability and high-energy storage capacity. However, imaging the nanoscale landscape of AFE domains is notoriously inaccessible, which has hindered development and intentional tuning of AFE materials. Here, we demonstrate that polarization-dependent photoemission electron microscopy (PD-PEEM) can resolve the arrangement and orientation of in-plane AFE domains on the nanoscale, despite the absence of a net lattice polarization. Through direct determination of electronic transition orientations and analysis of domain boundary constraints, we establish that antiferroelectricity in beta'-In2Se3 is a robust property from the nanometer to the 10s µm scale, confirming beta'-In2Se3 is an excellent candidate for applications requiring control of AFE polarization. Ultimately, the understanding of nanoscale AFE domain organization presented here opens the door to new investigations in the influence of domain formation and orientation on charge transport and dynamics.
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