Calibration method for multiwavelength Mueller matrix microscope based on dual DoFP polarimeters

Compared to traditional optical technology, polarization imaging can obtain more abundant microstructure and anisotropy information of the sample, and Mueller matrix contains the sample's complete polarization properties. In our previous study, we have established the Mueller matrix microscope based on dual DoFP polarimeters (DoFPs-MMM), which takes advantages of fast measurement speed and high measurement stability of DoFP polarimeters. However, compared to other polarization measurement schemes, the systematic errors of DoFPs-MMM are complex and difficult to analyze. In this paper, we propose a semi-modelled calibration method (SMCM) to achieve complete calibration of DoFPs-MMM, which only needs to establish the error model of the polarization states generator (PSG). The calibration method is based on solving the error model of PSG and then the instrument matrix of polarization states analyzer (PSA) can be directly calibrated by PSG. The performance of the calibration method is verified by measuring standard polarization samples using the multiwavelength DoFPs-MMM after calibration. The results show that the proposed calibration method has the advantages of accurate calibration, suitable for multiwavelength system, and convenient for operation.