佩多:嘘
结晶度
X射线光电子能谱
材料科学
拉曼光谱
电阻率和电导率
光谱学
导电聚合物
电子迁移率
分析化学(期刊)
化学工程
聚合物
化学
光电子学
复合材料
光学
物理
工程类
量子力学
色谱法
作者
Yuxin Jing,Yusuke Fukasawa,Hidenori Okuzaki
标识
DOI:10.35848/1347-4065/ad0cd9
摘要
Abstract The different grades of poly(3,4-ethylenedioxythiophene):poly(4-styrenesulfonate) (PEDOT:PSS) (Clevios P, PH500, and PH1000) were investigated to clarify the origin of the different electrical conductivities using X-ray photoelectron spectroscopy, dynamic light scattering, reflectance spectroscopy, X-ray diffraction, conductive atomic force microscopy, and Raman spectroscopy. The electrical conductivity (σ), crystallinity (X c), and carrier mobility (μ) increased in the order of Clevios P, PH500, and PH1000, whereas the composition ratio (α) and carrier density (N c) were almost the same. The results allowed us to conclude that the mechanism of different σ in the PEDOT:PSS lay in μ, where high X c with large size (D nc) and number (N nc) of PEDOT nanocrystals uniformly distributed within the PSS matrix favored carrier transport between adjacent nanocrystals, resulting in high σ in the bulk state.
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