显微镜
基准标记
光学
分辨率(逻辑)
光学显微镜
材料科学
光学(聚焦)
显微镜
千分尺
图像分辨率
荧光显微镜
跟踪(教育)
超分辨显微术
反射(计算机编程)
干涉测量
全内反射荧光显微镜
时间分辨率
干涉显微镜
薄层荧光显微镜
纳米
物理
计算机科学
荧光
计算机视觉
人工智能
扫描共焦电子显微镜
扫描电子显微镜
程序设计语言
心理学
教育学
作者
Binh Phan,Michael R. Stoneman,Sabita Sharma,Thomas D. Killeen,Valerică Raicu,Ionel Popa
出处
期刊:Nano Letters
[American Chemical Society]
日期:2025-02-03
被引量:1
标识
DOI:10.1021/acs.nanolett.4c05234
摘要
Optical microscopy excels at revealing the dynamics of biological systems in real time. However, focal drift limits most microscopy approaches to only several minutes in the absence of drift-mitigation strategies. Here we introduce focus readjustment for enhanced vertical resolution (FREVR), a method which uses micrometer-sized fiducial beads alongside the specimen. By tracking the interference fringes generated by these beads, FREVR can detect changes in focus position with nanometer precision. We showcase this approach on a microscope equipped with a high-speed CMOS camera used for bead tracking and a highly sensitive EMCCD camera tasked to quantify fluorescence with spectral resolution. Using this approach, we measured samples in focus for several hours on several single-molecule systems, as well as on mammalian cells having their actin filaments or membrane proteins fluorescently labeled. FREVR has the potential to dramatically increase the temporal and spatial resolution and the long-term stability of microscopy techniques.
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