扫描探针显微镜
材料科学
化学成像
激光烧蚀
扫描隧道显微镜
激光器
显微镜
拉曼光谱
近场扫描光学显微镜
扫描离子电导显微镜
光学
分析化学(期刊)
扫描探针显微镜振动分析
聚焦离子束
激光扫描
光学显微镜
扫描电子显微镜
扫描共焦电子显微镜
纳米技术
化学
高光谱成像
遥感
离子
复合材料
有机化学
色谱法
地质学
物理
作者
Dmitri Kossakovski,John D. Baldeschwieler,J. L. Beauchamp
标识
DOI:10.1017/s1431927600018171
摘要
Scanning Probe Microscopy (SPM) is a superb tool for topographical analysis of samples. However, traditional varieties of SPM such as Atomic Force, Scanning Tunneling and Near-field Scanning Optical Microscopy have limited chemical contrast capability. Recently, several advanced techniques have been reported which provide chemical information in addition to topographical data. All these methods derive advantage from combinations of scanning probe methodologies and some other, chemically sensitive technique. Examples of such approaches are: Near-field Scanning Raman Imaging, Near-field Scanning Infrared Microscopy and mass spectrometric analysis with laser ablation through fiber probes. In this contribution we report the development of a new method in this family of chemically sensitive scanning probe techniques: Laser Induced Breakdown Spectroscopy with Shear Force Microscopy, LIBS-SFM. Traditional LIBS experiments involve focusing a pulsed laser beam onto the sample and observing optical emission from the plasma formed in the ablation area. The emissions are mostly in the UV/visible range, and the signal is due to electronic transitions in excited atoms and ions in the plasma plume. The spectra are analyzed to identify chemical elements. The spatial resolution of LIBS is limited by the wavelength and beam quality of the laser used for ablation. The experiments may be conducted in vacuum, controlled atmosphere, or ambient air.
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