Crown ether enabled enhancement of ionic–electronic properties of PEDOT:PSS

) while tapping mode atomic force microscopy shows an increased phase separation. Further detailed characterization using spectroelectrochemistry, X-ray photoelectron spectroscopy (XPS) and grazing incidence wide-angle X-ray diffraction (GIWAXS) provides insight into the microstructural changes brought about by the crown ether additive that result in the desirable characteristics of the modified PEDOT:PSS film.