太赫兹辐射
电场
石英
物理
Crystal(编程语言)
光学整流
光学
采样(信号处理)
波形
材料科学
光电子学
电压
计算机科学
非线性光学
激光器
探测器
量子力学
复合材料
程序设计语言
作者
Maximilian Frenzel,Leona Nest,J. Urban,Michael S. Spencer,Sebastian F. Maehrlein
标识
DOI:10.1109/irmmw-thz57677.2023.10299107
摘要
The advancement of THz sources with peak fields exceeding 1 MV/cm poses the challenge to accurately measure these electric field transients without distortions in the electro-optic detection. Z-cut $\alpha$-quartz has been recently found as a suitable electro-optic sampling (EOS) crystal, but its accurate response function, which allows the THz electric field to be exactly determined from the measured EOS signal, was still elusive. Here, we employ intense THz fields (0.5-4 THz) generated via optical rectification in LiNbO 3 to measure EOS in quartz. By comparison with a traditional EOS crystal, we determine the quartz response function in both experiment and theory, and apply it to extract the exact THz field waveform. Our work therefore establishes a new standard for accurate measurement of intense THz electric fields using quartz, wherever conventional EOS materials face saturation effects or nonlinear distortions.
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