俄歇电子能谱
阴极
材料科学
无定形固体
微晶
图层(电子)
工作职能
扫描电子显微镜
光谱学
分析化学(期刊)
电子光谱学
纳米技术
结晶学
物理
化学
复合材料
物理化学
色谱法
量子力学
核物理学
冶金
作者
Xiaotao Liu,Bernard Vancil,Daniel B. Durham,D. Frank Ogletree,Edward S. Barnard,T. John Balk
标识
DOI:10.1109/ted.2023.3247539
摘要
To explain enhanced levels of electron emission from scandate cathodes, models invoking surface layers ( $\sim $ 100 nm thick) of Ba-Sc-O, or alternatively a Ba-Sc-O monolayer, have been frequently employed to describe the lowered work function that is thought to lead to these improved emission capabilities. However, limited direct experimental proof has been provided, primarily involving Auger electron spectroscopy (AES) for depth profile analyses of elemental composition. In this article, we report direct observations of an Sc-containing surface layer on scandate cathodes, as indicated by independent, complementary measurements using scanning nanobeam AES and electron energy loss spectroscopy (EELS) techniques. The ultrathin Sc-containing layer on these cathodes is no more than 3–4 nm thick and is likely even thinner than this. The surface layer may consist of amorphous or nanoscale polycrystalline materials, as suggested by scanning nanobeam electron diffraction and analytical mapping.
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