电子显微照片
显微照片
强度(物理)
电子
材料科学
光学
分布(数学)
能量(信号处理)
原子物理学
凝聚态物理
电子显微镜
物理
扫描电子显微镜
量子力学
数学
数学分析
作者
Shun Takagi,Kohtaro Ishida
摘要
Equal-thickness fringes in electron micrographs of aluminium single-crystal films have been energy-analysed. The intensity distribution in an ordinary E. M. image and that of electrons with negligible energy-loss have been measured. A phenomenological theory taking account of inelastic intra- and inter-band transitions and quasi-elastic inter-band transitions has been developed in good agreement with the experimental results. Reasonable values of the probabilities of these transitions are obtained.
科研通智能强力驱动
Strongly Powered by AbleSci AI