不连续性分类
纤锌矿晶体结构
间断(语言学)
异质结
半导体
凝聚态物理
材料科学
电子能带结构
宽禁带半导体
半金属
导带
化合物半导体
黄铜矿
带隙
结晶学
锌
化学
光电子学
物理
外延
纳米技术
铜
数学
冶金
量子力学
数学分析
电子
图层(电子)
作者
J. L. Shay,S. Wagner,J. C. Phillips
摘要
The discontinuity ΔEc=0.56 eV in the conduction band edge at n-CdS/p-InP junctions is reported. This discontinuity and others are compared with photoemission data and with Van Vechten’s extension of these data to many tetrahedrally coordinated semiconductors. Agreement between measured discontinuities and theoretical predictions is very good. Predictions are made for band parameters pertinent to interfaces involving AIIBIVCV2 compounds with zinc blende, chalcopyrite, or wurtzite crystal structures.
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