多物理
材料科学
数据表
背景(考古学)
微观结构
中尺度气象学
机械工程
有限元法
微尺度化学
电子工程
复合材料
工程类
结构工程
物理
古生物学
气象学
数学教育
生物
数学
作者
Zhiheng Huang,Hua Xiong,Zhiyong Wu,Paul Conway,Hugh Davies,Alan Dinsdale,Yunfei En,Qingfeng Zeng
出处
期刊:Chinese Science Bulletin
[Springer Nature]
日期:2014-01-29
卷期号:59 (15): 1696-1708
被引量:2
标识
DOI:10.1007/s11434-013-0103-7
摘要
Semiconductor technology and packaging is advancing rapidly toward system integration where the packaging is co-designed and co-manufactured along with the wafer fabrication. However, materials issues, in particular the mesoscale microstructure, have to date been excluded from the integrated product design cycle of electronic packaging due to the myriad of materials used and the complex nature of the material phenomena that require a multiphysics approach to describe. In the context of the materials genome initiative, we present an overview of a series of studies that aim to establish the linkages between the material microstructure and its responses by considering the multiple perspectives of the various multiphysics fields. The microstructure was predicted using thermodynamic calculations, sharp interface kinetic models, phase field, and phase field crystal modeling techniques. Based on the predicted mesoscale microstructure, linear elastic mechanical analyses and electromigration simulations on the ultrafine interconnects were performed. The microstructural index extracted by a method based on singular value decomposition exhibits a monotonous decrease with an increase in the interconnect size. An artificial neural network-based fitting revealed a nonlinear relationship between the microstructure index and the average von Mises stress in the ultrafine interconnects. Future work to address the randomness of microstructure and the resulting scatter in the reliability is discussed in this study.
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