暗电流
光电探测器
光电子学
材料科学
信号(编程语言)
肖特基二极管
氧化物
噪音(视频)
信噪比(成像)
肖特基势垒
光学
物理
冶金
计算机科学
人工智能
程序设计语言
图像(数学)
二极管
作者
Yujin Liu,Jundong Zhu,Dawei Xie,Yuxin Gao,Yong Yan,Wanjun Li,Zhong Ji,Chuanxi Zhao,Wenjie Mai
标识
DOI:10.1088/1361-6463/ab7fd7
摘要
Abstract Photodetectors (PDs) as image sensors have been widely used in imaging system due to their outstanding photosensitivity. The improvement of imaging quality (signal-to-noise ratio (SNR)) can be realized by reducing the dark current of PDs. Conventionally, interfacial engineering can effectively suppress the dark current of PDs. Nevertheless, these techniques are hard to be applied in practical imaging systems owing to their complicated process. In this work, we proposed a facile method to reduce the dark current of Cu 2 O/Au Schottky PDs, and further demonstrated its application in high SNR imaging system. By applying a small external bias of −120 μ V, the dark current of PDs decreases from 27 nA to 0.6 nA, with 4023% improvements of ON/OFF ratio. Additonaly, a model based on free carriers generated by rich trap-state and thermal excitation under asymmetric internal electric field was proposed to understand this phenomenon. Finally, a high-resolution image with high SNR (48 dB) was acquired, which is close to that of commercial Si-CDD and CMOS. Our results provide a convenient way to reduce the dark current and improve the image quality, also suggest Cu 2 O is potentially an attractive candidate to be applied in optical imaging applications.
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