扫描透射电子显微镜
扫描电子显微镜
材料科学
表征(材料科学)
常规透射电子显微镜
扫描共焦电子显微镜
光学
显微镜
电子断层摄影术
倾斜(摄像机)
能量过滤透射电子显微镜
透射电子显微镜
电子束诱导沉积
探测器
纳米技术
物理
复合材料
工程类
机械工程
作者
Cheng Sun,Stefan Lux,Erich Müller,Matthias Meffert,D. Gerthsen
标识
DOI:10.1007/s10853-020-04970-3
摘要
Abstract Scanning electron microscopy (SEM) is an indispensable characterization technique for materials science. More recently, scanning electron microscopes can be equipped with scanning transmission electron microscopy (STEM) detectors, which considerably extend their capabilities. It is demonstrated in this work that the correlative application of SEM and STEM imaging techniques provides comprehensive sample information on nanomaterials. This is highlighted by the use of a modern scanning electron microscope, which is equipped with in-lens and in-column detectors, a double-tilt holder for electron transparent specimens and a CCD camera for the acquisition of on-axis diffraction patterns. Using multi-walled carbon nanotubes and Pt/Al 2 O 3 powder samples we will show that a complete characterization can be achieved by combining STEM (mass-thickness and diffraction) contrast and SEM (topography and materials) contrast. This is not possible in a standard transmission electron microscope where topography information cannot be routinely obtained. We also exploit the large tilt angle range of the specimen holder to perform 180 degrees STEM tomography on multi-walled carbon nanotubes, which avoids the missing wedge artifacts.
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