硫脲
发光
带材弯曲
自发辐射
辐射传输
电致发光
带隙
材料科学
无辐射复合
阴极
钝化
分析化学(期刊)
化学
光电子学
半导体
光学
物理化学
物理
纳米技术
半导体材料
有机化学
激光器
图层(电子)
色谱法
作者
Kazuyoshi Nakada,Takahito Nishimura,Naoki Suyama,Akira Yamada
标识
DOI:10.35848/1347-4065/abdf16
摘要
Abstract Cross-sectional cathode luminescence (CL) was performed on working Cu(In,Ga)Se 2 (CIGS) solar cells to clarify the mechanism behind the performance improvement of solar cells subjected to a thiourea treatment. The low panchromatic CL intensity at the depletion zone demonstrates that the existent electric field sweeps the carriers nearby, lowering their possibility of non-radiative and radiative recombination. Accordingly, the low CL intensity at grain boundaries are not necessarily caused by high non-radiative recombination rate if band bending is present. The photon energy mapping showed an emission distribution according to the double-graded bandgap profile. A blue shift in photon emission at the minimum bandgap area was observed for the thiourea-treated sample. We presume that S ions provided by the thiourea solution passivate subgap defects such as donor-type Se vacancies, resulting in radiative transitions with higher energies and higher net carrier density that eventually contributed to the higher fill-factor and higher open-circuit voltage.
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