Theoretical analysis of a spectrometric interferometer based on silicon-on insulator (SOI) waveguide layers

The paper presents an analysis of spectral interference in silicon-on-insulator (SIO) planar waveguide structures. The analysis was performed for the wavelength range of 1540nm-1560nm. The TE₀ and TM₀ orthogonal modes which propagate in this wavelength range are considered. At the output of the system, an interference signal behind a polarizer can be recorded. If a spectrometer is used as a detector, the recorded signal is a function of the wavelength. Change in the propagation conditions results in a change of the recorded signal shape.