电致发光
光电子学
带隙
材料科学
钙钛矿(结构)
二极管
发光二极管
俄歇效应
量子点
宽禁带半导体
载流子
单层
电子
电压
图层(电子)
纳米技术
化学
物理
量子力学
结晶学
作者
Xulan Xue,Jialin Bai,Han Zhang,Wenyu Ji
摘要
Electroluminescence (EL) at sub-bandgap voltages has been observed in perovskite light-emitting diodes (PeLEDs), which, however, does not appear as a universal phenomenon in current reports, and the mechanism remains in debate. Herein, we verify that the turn-on voltage of PeLEDs depends neither on the carrier injection nor on the energy levels of charge-transport layers, ruling out the Auger-assisted upconversion charge injection effect. The recombination of diffused and thermally generated charge carriers, rather than the high-order effect, is believed to be responsible for the sub-bandgap EL behavior. Moreover, we demonstrate that a critical prerequisite for the sub-bandgap EL is the strong confinement of charge carriers in the emissive layer, which can be achieved by inserting a CdSe/ZnS quantum-dot monolayer at the interface of the perovskite/electron-transport layer. The accumulated holes induced by the CdSe/ZnS monolayer can reduce the electron-injection barrier, thus leading to an observable EL at a sub-bandgap voltage. Our work provides a substantial evidence for the sub-bandgap EL turn-on processes and addresses the debate in PeLEDs.
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